Evaluation of introgression lines of winter bread wheat with the traits of resistance to fungal and viral diseases
Abstract
Aim. To determine the productivity of newly developed introgression wheat lines depending on the origin of alien traits and the level of resistance to fungal and viral diseases. Methods. Field trials, plant pathological assessment, and analysis of variance. Results. Powdery mildew and rust diseases did not cause significant yield losses in the introgression lines due to their low natural infection pressure. Yellow rust was the most harmful, but significantly reduced yield only in the most susceptible genotypes. Viral diseases affected all lines similarly and reduced yield regardless of the origin of alien traits. The lines with high group resistance to diseases or alien morphological traits were often low-yielding; however, some lines carrying the modified wheat–rye translocation 1BL.1RSm showed better adaptability and productivity. The breeding lines combining group disease resistance and high yield were identified with low frequency, some of which were included in further breeding programs. Conclusions. The combination of high yield and group disease resistance is possible, although rare, indicating the complexity but promising potential of introgression breeding of winter bread wheat, particularly the successful use of resistance genes localized in the 1BL.1RSm translocation.
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